Parameterization of Debye Model for Dielectrics Using Voltage Response Measurements and a Benchmark Problem

The Voltage Response measurement since its introduction in the 1960s has been used successfully for diagnostics of electrical insulation. method is based on two quantities decay and return voltage slopes can be to study conduction polarization processes inside Extended method, being an advanced version helps further studying process by using a large spectrum hence dielectric relaxation processes. These modeled Debye model. Since as most techniques diagnostic purpose does not give information about separately, it difficult determine R-C parameters technique very useful this regard because slopes. paper shows novel experimental benchmark testing function fitting methodologies methodologies, which determining parameters. Moreover, problem genetic, evolutionary algorithms, where benchmarking actual challenge. proposed nonlinear uses genetic algorithms via Ārtap framework, lets possible select accurate optimization algorithm from provided list achieve better precision, faster calculation time or more powerful processing ability.